参考文献：
　　[1] 费翔,钱可元,罗毅.大功率LED结温测量及发光特性研究[J].光电子·激光,2008,19(2):289-292.
　　[2] Min-Ho Kim,Martin F.Schubert,Qi Dai,et al.Origin of efficiency droop in GaN-based light-emitting diodes[J].Appl Phys.Lett,2007,91:183507.
　　[3] Lee C Y,Su A,Liu Y C,et al.In situ measurement of the junction temperature of light emitting diodes using a flexible micro temperature sensor[J].Sensors,2009,9(7):5068.
　　[4] Xi Y,Xi J Q,Gessmann T,et al.Junction and carrier temperature measurements in deep-ultraviolet light-emitting diodes using three different methods[J].Appl Phys.Lett.,2005,86(3):031907.
　　[5] Quan Chen,Xiaobing Luo,Sheng Liu.Junction temperature testing system of LED design and measurement[J].7th China International Forum on Solid State Lighting,2010:313-316.
　　[6] Schubert E F.Light Emitting Diodes[M].2nd ed.Cambridge:Cambridge University Press,2006.
 

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